Overview of STMicroelectronics M24C08
The M24C08 from STMicroelectronics is a state-of-the-art 8-Kbit serial EEPROM (Electrically Erasable Programmable Read-Only Memory) device that operates with a voltage range of 2.5V to 5.5V. Designed for flexible and reliable data storage, this memory chip is an ideal solution for sophisticated applications requiring data persistence and low power consumption.
Key Features
- Memory Size: The device offers an 8-Kbit capacity, organized as 1K x 8 bits, which is suitable for storing configuration parameters, settings, or small application data.
- Interface: It utilizes the I²C serial interface, ensuring compatibility with a vast array of microcontrollers and processors. This two-wire interface simplifies the connectivity and allows multiple devices to share the same bus.
- Write Cycle Time: The M24C08 features a fast write cycle time of 5 ms (max), facilitating rapid updates to stored data.
- Write Protect: It includes a hardware write control feature, providing an additional layer of data security and preventing accidental data overwrites.
- Endurance: High reliability is assured with an endurance of 1 million write cycles and a data retention period of 40 years, ensuring the data remains intact over extensive use and time.
Applications
The M24C08 EEPROM is versatile and can be used across various applications that require low-power and reliable non-volatile memory. It is commonly found in:
- Consumer electronics
- Mobile devices
- Industrial controls
- Medical equipment
- Automotive systems
Package Options and Temperature Range
The M24C08 is available in a variety of package options, including SO8, TSSOP8, UDFPN8, and WLCSP, catering to different design requirements. It also operates over a wide temperature range from -40°C to +85°C, making it suitable for harsh environments.
By integrating the M24C08 into your design, you can trust in the quality and expertise that STMicroelectronics brings to non-volatile memory technology, ensuring your product's performance and reliability.
