LTC4355IS - Dual Low Voltage Ideal Diode Controller from Linear Technology

The LTC4355IS is a robust dual low voltage ideal diode controller designed to replace power Schottky diodes with N-channel MOSFETs for a more efficient, lower loss alternative. Engineered by Linear Technology, a leader in high-performance analog integrated circuits, this device is perfect for systems requiring a seamless transition between redundant power supplies, or for those looking to minimize power consumption and heat dissipation.

Key Features

• Wide Operating Voltage Range: The LTC4355IS operates over a broad voltage range from 9V to 80V, making it versatile for various applications.
• Low Loss Replacement: It serves as a more efficient substitute for Schottky diodes by significantly reducing the voltage drop and power loss, thanks to the use of external N-channel MOSFETs.
• Smooth Switchover: The device ensures smooth switchover between power sources without oscillation, providing reliable operation in redundant power supply systems.
• Reverse Input Protection: It offers protection against reverse input, safeguarding downstream components from potential damage.
• Adjustable Turn-On Voltage: Users can adjust the turn-on voltage to suit specific application needs, enhancing flexibility and control.

Applications

The LTC4355IS is ideal for a range of applications, including:

• Redundant Power Supply Systems
• High Availability Systems
• ORing Power Inputs
• Telecom Infrastructure
• Automotive and Industrial Systems

Product Specifications

Encased in a 16-lead SSOP package, the LTC4355IS operates within an industrial temperature range of -40°C to 85°C, ensuring reliability and performance even in harsh conditions. Its low quiescent current and gate control for the external MOSFETs make it a power-efficient solution for modern electronic systems.

With its advanced features and Linear Technology's reputation for quality, the LTC4355IS stands out as a superior choice for system designers looking to enhance power system efficiency and reliability.