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CY62167EV30LL-45ZXAT

Part No CY62167EV30LL-45ZXAT
Manufacturer Cypress Semiconductor Corp
Catalog IT infrastructure Memory
Description SRAM 1Mx16
Sample
Rohs State rohs
ECAD Module
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Category IT infrastructure Memory
Win Source Part Number 1455571-CY62167EV30LL-45ZXAT
Manufacturer Cypress Semiconductor Corp
Package Tape & Reel (TR)
Product Status Active
Memory Type Volatile
Memory Format SRAM
Technology SRAM - Asynchronous
Memory Size 16Mbit
Memory Organization 2M x 8, 1M x 16
Memory Interface Parallel
Write Cycle Time - Word, Page 45ns
Access Time 45ns
Voltage - Supply 2.2 V ~ 3.6 V
Operating Temperature -40°C ~ 85°C (TA)
Grade -
Mounting Type Surface Mount
Package / Case 48-TFSOP (0.724", 18.40mm Width)
Supplier Device Package 48-TSOP I
Ultra Librarian 3D Model Ultra Librarian CY62167EV30LL-45ZXAT CAD Model

Description

The CY62167EV30LL-45ZXAT is a 1M x 16-bit static RAM (SRAM) developed by Cypress, now part of Infineon Technologies. It is engineered for high-speed operation, featuring a 45 ns access time that makes it suitable for applications requiring fast data access, such as advanced telecommunications systems, industrial controls, and automotive electronics. This SRAM provides an asynchronous interface for ease of integration into a wide range of applications, without the need for clock synchronization. Its low-power design, coupled with a deep power-down mode, ensures minimal energy consumption during operation and standby, making it ideal for battery-operated and power-sensitive devices. The CY62167EV30LL-45ZXAT is housed in a TSOP II package, which is optimized for space efficiency and compatibility with standard surface-mount technology, offering a compact footprint for densely packed electronic assemblies. Cypress is recognized for its commitment to reliability and quality, ensuring that this high-performance SRAM component meets the stringent requirements of today's sophisticated digital environments, offering a dependable, high-speed memory solution that enhances the overall system performance and reliability.

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