The S-80828ANUP-EDR-T1 is a voltage detector IC manufactured by SII Semiconductor Corporation. Its primary function is to monitor the input voltage of a system and generate a reset signal when the voltage falls below a specified threshold. This prevents malfunctions and data corruption in microcontrollers, microprocessors, and other digital circuits that can occur during undervoltage events. This IC is crucial for maintaining stable and reliable system performance.
Applications
- Microcontroller reset circuits
- Power supply monitoring
- Battery-powered devices
- Portable electronic equipment
- Industrial control systems
Features
- Detection Voltage: 2.8V (Typical)
- High-precision voltage detection
- Ultra-low current consumption
- Small package size (SOT-23-5)
- Built-in hysteresis characteristics
- Open drain output
Benefits
- Prevents system failures and data loss due to undervoltage conditions.
- Extends battery life in portable applications because of its low power consumption.
- Reduces board space requirements due to the small form factor.
- Provides reliable and accurate voltage monitoring.
- Simplifies circuit design with integrated functionality.
The S-80828ANUP-EDR-T1 boasts a highly accurate detection voltage, enabling precise monitoring of the supply voltage. Its ultra-low current consumption is especially beneficial for battery-operated devices, helping to extend battery life. The inclusion of hysteresis ensures a stable and clean reset signal, preventing unwanted oscillations. Its open-drain output provides flexible interfacing capabilities with different microcontroller and microprocessor architectures. The small SOT-23-5 package allows for easy integration into compact electronic designs.
This voltage detector finds widespread use in applications where a stable and reliable power supply is essential. It provides a simple and effective method for safeguarding sensitive electronic components from damage caused by undervoltage conditions. Its compact size makes it particularly well-suited for use in space-constrained applications.