STMicroelectronics 74V1G07CTR - Single Non-Inverting Buffer with Open Drain Output

The 74V1G07CTR is a high-speed Si-gate CMOS device that is part of STMicroelectronics' extensive logic family. This single non-inverting buffer is designed with an open-drain output, making it ideal for interfacing with other logic families and driving capacitive or resistive loads. Its open-drain output also allows for wired-OR functions in complex logic circuits.

Key Features

• High-Speed Performance: The 74V1G07CTR operates at a voltage range of 2.0V to 5.5V, ensuring compatibility with a broad range of applications and providing high-speed performance that meets the demands of modern electronic systems.
• Low Power Consumption: This device has been optimized for low power consumption, making it suitable for battery-operated and power-sensitive applications.
• Open-Drain Output: The open-drain output configuration allows for direct interfacing with other logic levels or the creation of wired-OR logic gates without the need for external components.
• Wide Operating Voltage Range: With an operating voltage range from 2.0V to 5.5V, the 74V1G07CTR can be used in various systems without the need for level shifters.
• High Noise Immunity: Characterized by high noise immunity, the device is robust against electrical noise, making it suitable for industrial and automotive environments.

Applications

The versatility of the 74V1G07CTR makes it an excellent choice for a multitude of applications, including:

• Logic level shifting
• Line driving
• Power management
• Signal buffering
• Automotive systems
• Embedded systems

Package Information

The 74V1G07CTR is available in an SOT-323-5 package, which is designed for space-saving on PCBs while ensuring reliable connectivity and performance. Its compact size makes it suitable for high-density circuit designs.

Quality and Reliability

STMicroelectronics is known for its commitment to quality and reliability. The 74V1G07CTR is manufactured to meet the highest industry standards, ensuring long-term reliability and performance for critical applications.