STMicroelectronics M74HC393RM13TR Dual Binary Counter

The M74HC393RM13TR from STMicroelectronics is a high-speed CMOS dual 4-bit binary ripple counter integrated circuit, designed to operate in a wide range of applications, from consumer electronics to sophisticated industrial systems. This advanced technology device is tailored to count the number of pulses it receives from the clock inputs of each counter.

Product Features:

• Advanced High-Speed CMOS: The M74HC393RM13TR utilizes high-speed silicon gate CMOS technology to achieve operating speeds similar to LSTTL with the low power consumption of standard CMOS integrated circuits.
• Dual 4-bit Counters: This IC features two independent 4-bit binary counters, each having a clear and a clock input. The counters advance on the falling edge of the clock signal, providing a versatile counting capability.
• Asynchronous Reset: An asynchronous reset input is provided for each counter, which resets the counter to its zero state when held at a high logic level, regardless of other inputs.
• Wide Operating Voltage Range: The M74HC393RM13TR operates at a wide voltage range from 2V to 6V, making it suitable for battery-operated devices and other applications requiring a broad supply voltage spectrum.
• Low Power Consumption: Its low power requirements make it ideal for use in portable and power-sensitive devices.
• High Noise Immunity: The high noise immunity of 0.5 VCC (typical) ensures stable operation in harsh electrical environments.
• Output Drive Capability: The device can drive up to 10 LSTTL loads, providing ample current for most applications.

Applications:

The M74HC393RM13TR is suitable for a variety of applications including:

• Time Delay Generators
• Frequency Dividers
• Counters and Timers
• Real-Time Clocks
• Sequential State Machines

Package and Quality:

Supplied in a small surface-mount package, the M74HC393RM13TR is designed for optimized board space efficiency. STMicroelectronics assures high-quality standards, with each device undergoing rigorous testing to meet the demands of a wide array of applications.