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TC74HCT32AP(F)

Part No TC74HCT32AP(F)
Manufacturer Toshiba Semiconductor and Storage
Catalog HOT - SALES and EOL Components (T)
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Rohs State Need to verify
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Manufacturer Toshiba Semiconductor and Storage
Win Source Part Number 357735-TC74HCT32AP(F)
Popularity Low
Supply and Demand Status Limited
Ultra Librarian 3D Model Ultra Librarian TC74HCT32AP(F) CAD Model

Description

The TC74HCT32AP(F) is a high-speed CMOS quad 2-input OR gate fabricated with silicon gate C2MOS technology. It offers high-speed performance comparable to equivalent Schottky TTL devices while maintaining the low power consumption characteristic of CMOS circuits. This device is designed for a variety of applications requiring OR logic functions.

Applications

  • General-purpose logic circuits
  • Computer systems
  • Industrial automation equipment
  • Instrumentation and measurement devices
  • Consumer electronics products

Features

  • High-speed operation: tpd = 9 ns (typ.) at VCC = 5 V
  • Low power dissipation: ICC = 4 μA (max) at Ta = 25°C
  • High noise immunity: VNIH = VNIL = 28 % VCC (min)
  • Output drive capability: 10 LSTTL loads
  • Symmetrical output impedance: |IOH| = IOL = 4 mA (min)
  • Balanced propagation delays: tPLH ≈ tPHL
  • Wide operating voltage range: VCC = 4.5 V to 5.5 V

Benefits

  • Improved system speed and responsiveness due to fast switching characteristics.
  • Reduced energy consumption, contributing to energy savings and suitability for battery-powered applications.
  • Reliable operation in electrically noisy environments due to high noise immunity.
  • Easy integration with existing TTL logic circuits.
  • Consistent performance due to matched propagation delays.

Additional Details

The TC74HCT32AP(F) is available in a 14-pin DIP (Dual In-Line Package). It's designed to be pin-compatible with standard TTL logic gates. It functions reliably over a temperature range of -40°C to +85°C. The inputs incorporate protection against electrostatic discharge. Ensure that absolute maximum ratings are adhered to, in order to prevent damage to the IC.

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