Product Overview

The MAX6315US47D4-T is a low-power, highly reliable microprocessor (µP) supervisory circuit designed and manufactured by Maxim Integrated. This component is engineered to maintain system integrity by monitoring the power supply voltage in digital systems. It is especially suitable for use in portable and battery-powered applications due to its low energy consumption and small footprint.

Key Features

• Precision Voltage Monitoring: The MAX6315US47D4-T offers precise monitoring of the 4.7V power-supply voltage, ensuring that the connected microprocessor is always operating within safe voltage levels.
• Low Power Consumption: With its low power requirements, this supervisory circuit is an ideal choice for power-sensitive applications, helping to extend battery life and reduce energy costs.
• Reset Signal: This device provides a reset signal output, which is asserted when the monitored voltage falls below the factory-set reset threshold, protecting the µP from operating under potentially harmful conditions.
• Reset Timeout: After the power supply voltage returns to an acceptable level, the reset signal remains asserted for a preset timeout period, allowing the system to stabilize before resuming normal operation.
• Compact SOT-143 Package: The MAX6315US47D4-T comes in a small SOT-143 package, making it a space-saving solution for PCB designs where board space is at a premium.
• Temperature Range: This device operates over an extended temperature range, making it suitable for use in environments with varying temperature conditions.

Applications

The MAX6315US47D4-T is versatile in its applications and can be used in a variety of settings, including:

• Portable Devices
• Battery-Powered Equipment
• Embedded Systems
• Computers and Servers
• Industrial Controllers

With its combination of features, the MAX6315US47D4-T is a robust solution for ensuring the reliability and stability of electronic systems. Its integration into a design can help prevent data corruption, system crashes, and other power-related issues that could compromise the performance and longevity of critical applications.