Microchip Technology's 25LC160D-I/SN Serial EEPROM

The 25LC160D-I/SN is a high-performance, 16 Kbit Serial Electrically Erasable Programmable Read-Only Memory (EEPROM) device from the reputable manufacturer Microchip Technology. Designed to meet the rigorous demands of modern electronic systems, this EEPROM offers a convenient and flexible storage solution for various applications, including industrial, automotive, and consumer electronics.

Key Features

• Memory Size: The device provides 16 Kbits of memory, which is organized as 2,048 x 8 bits, making it suitable for storing configuration parameters, device metadata, or small application data.
• Interface: It utilizes a serial peripheral interface (SPI) that ensures fast data transfer rates and simple integration into most microcontroller-based systems.
• Operating Voltage: The 25LC160D-I/SN operates at a voltage range of 2.5V to 5.5V, which makes it adaptable to both low- and standard-voltage applications.
• Temperature Range: This EEPROM is robust and reliable, with an industrial temperature range of -40°C to +85°C, ensuring performance in harsh environments.
• Packaging: The device comes in an 8-pin SOIC (SN) package, which is widely used and easily integrated into various circuit board layouts.
• Write Protection: It features hardware write-protect pins to prevent inadvertent writes, which enhances data security and integrity.
• Endurance: The EEPROM boasts a high endurance of 1 million write cycles per each memory location and a data retention period of over 200 years, ensuring long-term reliability.

Applications

The versatility of the 25LC160D-I/SN makes it a great choice for a multitude of applications. It is commonly used in:

• Industrial control systems
• Automotive electronics
• Medical devices
• Smart cards
• Networking equipment
• Portable consumer devices

With its combination of durability, flexibility, and ease of use, the Microchip Technology 25LC160D-I/SN Serial EEPROM is an excellent choice for designers and engineers looking to enhance the performance and reliability of their electronic systems.