The 74AVCH16T245GRG4 is a high-performance, dual-supply, bidirectional voltage-level translator from Texas Instruments, designed for multi-voltage digital system applications. This device is part of the AVC (Advanced Very-Low Voltage CMOS) family and is optimized for translation applications that require high speed and low power consumption.

Key Features

• Wide Voltage Range: This device supports translation from 1.2V to 3.6V on the A side and 1.65V to 5.5V on the B side, allowing for flexibility in interfacing between different voltage domains.
• High-Speed Operation: With a maximum data rate of 380 Mbps (190 MHz), the 74AVCH16T245GRG4 is suitable for high-speed signal transmission without compromising signal integrity.
• Low Power Consumption: The device is designed for low power dissipation, which is critical for battery-powered and power-sensitive applications.
• Bus Hold Function: It incorporates a bus hold feature that retains the last active state during Tri-State or power-off conditions, reducing the need for external pull-up or pull-down resistors.
• Direction Control: Direction control inputs (DIR) determine the direction of data flow, making the device versatile for various data communication protocols.
• Output Enable (OE) Feature: The OE input disables the outputs, allowing the outputs to enter a high-impedance state, which is useful for interfacing with shared data buses.

Applications

The 74AVCH16T245GRG4 is ideal for a wide range of applications that require voltage level translation, such as interfacing between different logic levels in mixed-voltage systems. Common applications include mobile phones, consumer electronics, networking and telecommunication equipment, and industrial control interfaces.

Package and Quality

This device is offered in a TSSOP-48 (Thin Shrink Small Outline Package) which provides a compact footprint for space-constrained applications. Texas Instruments ensures high-quality standards, and the 74AVCH16T245GRG4 is no exception, meeting or exceeding industrial quality and reliability benchmarks.