Product Overview: 74LVC38APW,118

The 74LVC38APW,118 is a high-performance, low-voltage CMOS device manufactured by NXP Semiconductors. This integrated circuit is part of the LVC family, which is known for its low-voltage operation and compatibility with TTL levels. The 74LVC38APW,118 is designed to meet the requirements of a wide range of digital applications, particularly those demanding higher speed and lower power consumption.

Key Features

• Logic Type: Quad 2-input NAND gate with open-drain outputs.
• Supply Voltage Range: 1.2V to 3.6V, allowing for use in low-voltage applications.
• High-Speed Performance: Offers a typical propagation delay of 3.7ns at 3.3V, ensuring fast response times for critical applications.
• IOH/IOL: High output drive capability with -32 mA/+32 mA at 3.3V.
• Power-Down Protection: Inputs and outputs are equipped with power-down protection to prevent damaging current backflow when the device is powered off.
• ESD Protection: HBM JESD22-A114E exceeds 2000V and MM JESD22-A115-A exceeds 200V, providing robust protection against electrostatic discharge events.
• Package: Comes in a TSSOP14 (thin shrink small outline package) with 14 leads, offering a compact footprint suitable for space-constrained applications.
• Latch-Up Performance: Meets JESD78 Class II level B with a latch-up current of 250 mA, enhancing system reliability.

Applications

The 74LVC38APW,118 is versatile and can be used in a variety of digital circuits. Its open-drain outputs make it suitable for wired-AND and bus-driving applications. This device is commonly used in:

• Telecommunications
• Computers and computer peripherals
• Consumer electronics
• Networking equipment
• Portable devices

Environmental and Quality Certifications

NXP Semiconductors is committed to environmental stewardship and quality. The 74LVC38APW,118 is compliant with RoHS (Restriction of Hazardous Substances) and is lead-free, minimizing its environmental impact. Additionally, it is supported by NXP's quality assurance processes to ensure reliability and performance in the field.