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K6R4016C1D-TC15

Part No K6R4016C1D-TC15
Manufacturer Samsung
Catalog OEM Parts (J - L)
Sample
Rohs State Need to verify
ECAD Module
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RoHS Non-Compliant
Win Source Part Number 1066856-K6R4016C1D-TC15
Categories OEM Parts(J-L)
Manufacturer Samsung
Popularity Low
Supply and Demand Status Shortage
Ultra Librarian 3D Model Ultra Librarian K6R4016C1D-TC15 CAD Model

Description

The Samsung K6R4016C1D-TC15 is a high-speed, low-power CMOS Static Random Access Memory (SRAM) chip. It's designed for applications requiring rapid data access and storage with minimal energy consumption.

Applications

  • Cache memory in computing systems
  • High-performance embedded systems
  • Networking equipment (routers, switches)
  • Digital signal processing (DSP) applications
  • Industrial control systems

Features

  • Fast access time: 15ns (indicated by TC15)
  • 4 Mbit density (256K x 16 bit organization)
  • Low operating current
  • Single 3.3V power supply
  • TTL-compatible inputs and outputs
  • Available in various package options (consult datasheet)

Benefits

  • Enhances system performance with quick data retrieval and storage.
  • Reduces overall power consumption, making it suitable for battery-powered devices.
  • Simplifies system design with a single power supply requirement.
  • Enables easy integration with other TTL logic components.
  • Provides flexibility in design with various package options.

Additional Details

The K6R4016C1D-TC15 is fabricated using Samsung's advanced CMOS technology, ensuring both speed and power efficiency. This SRAM retains data as long as power is supplied. The 'TC15' suffix denotes a 15 nanosecond access time. Consult the official Samsung datasheet for comprehensive specifications, including detailed timing diagrams, power consumption figures, and package dimensions. Careful consideration of signal integrity, power supply decoupling, and thermal management is essential for optimal performance. This component is often employed in demanding applications where speed and reliability are critical.

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