The S-80815CNNB-B8AT2G is a voltage detector IC manufactured by SII Semiconductor Corporation. This device is designed to monitor voltage levels in electronic circuits and generate a reset signal when the voltage drops below a specified threshold. Its primary function is to protect sensitive electronic components from damage or malfunction caused by undervoltage conditions.

Applications

• Microcontroller reset circuits
• Power management systems
• Battery-powered devices
• Portable electronic equipment
• Industrial control systems

Features

• Detection voltage: 1.5V (typical)
• High-accuracy voltage detection
• Ultra-low current consumption
• Built-in hysteresis characteristics
• Small package size (SOT-23-3)
• N-channel open drain output

Benefits

• Prevents system errors and data corruption due to undervoltage conditions
• Extends battery life in portable devices because of its low current consumption
• Ensures stable system operation by providing a reliable reset signal
• Simplifies circuit design due to integrated features
• Saves board space thanks to its compact package

Additional Details

The S-80815CNNB-B8AT2G operates with a typical detection voltage of 1.5V. The high-accuracy detection voltage ensures precise voltage monitoring. The built-in hysteresis prevents chattering or oscillations around the threshold voltage, ensuring stable operation. It comes in a small SOT-23-3 package, making it suitable for space-constrained applications. The device features an N-channel open drain output, allowing for flexible interfacing with various microcontrollers and other digital circuits. The ultra-low current consumption is particularly beneficial in battery-powered applications, where minimizing power drain is crucial. The voltage detector generates a reset signal when the supply voltage drops below the specified detection voltage, preventing the microcontroller or other digital circuitry from operating incorrectly. This offers a simple and reliable solution for voltage monitoring and reset functions, enhancing the overall robustness of electronic systems.