SN74LV374ATDB Octal Edge-Triggered D-Type Flip-Flops

The SN74LV374ATDB from Texas Instruments is a high-performance, octal edge-triggered D-type flip-flop integrated circuit. This device features a robust design that is specifically engineered to directly interface with 5V TTL logic while operating at a lower voltage, making it ideal for mixed-voltage applications. It captures data on the rising edge of the clock signal, ensuring reliable and precise data transfer within your digital systems.

Key Features

• Logic Family: LV - Low-Voltage CMOS
• Logic Type: D-Type Flip-Flop
• Number of Bits: 8 bits per flip-flop, 64 bits in total
• Output Type: 3-State Outputs
• Supply Voltage Range: 2.7V to 3.6V
• Maximum Clock Frequency: 160 MHz
• Operating Temperature Range: -40°C to 85°C
• Package: 48-Pin SSOP (Shrink Small-Outline Package)

The SN74LV374ATDB is designed with the purpose of offering high-speed operation while maintaining the low power consumption of CMOS technology. This makes it an excellent choice for implementing memory registers, buffers, and control devices in a wide range of applications, including telecommunications, computing systems, and complex industrial equipment.

Advantages

One of the significant advantages of the SN74LV374ATDB is its 3-state outputs, which can be used to place the eight outputs in a high-impedance state. This feature is particularly useful in bus-oriented systems where multiple outputs must share a common bus line without interference.

Additionally, the device's wide operating voltage range and high clock frequency capability provide designers with the flexibility to use it in systems that require fast data processing and low-voltage operation. Its robust temperature range ensures reliable performance even in extreme environmental conditions.

Overall, the SN74LV374ATDB from Texas Instruments is a versatile and reliable component that can significantly enhance the performance and efficiency of digital systems, making it a top choice for engineers and designers looking for quality and durability.