The SN74LVTH18504APMG4 is a high-performance, 3.3-V ABT SCAN TEST device with 20-bit bus-interface registers designed specifically for low-voltage (3.3 V) VCC operation, yet with the capability to provide a TTL interface to a 5-V system environment. This device is manufactured by Texas Instruments, a leader in the semiconductor industry known for their innovative and reliable products.

Key Features:

• Technology: The device utilizes Texas Instruments' BiCMOS technology, which combines the high speed of Bipolar with the low power consumption of CMOS.
• Logic Type: 20-Bit Bus Interface Register with 3-State Outputs, providing a robust interface for bus-oriented applications.
• Voltage Range: Operates from a 2.7 V to 3.6 V supply, making it compatible with low-voltage systems and ensuring power efficiency.
• Interface: TTL-compatible inputs and outputs, ensuring compatibility with 5 V systems and facilitating easy integration into mixed-voltage environments.
• Performance: High drive (–32-mA IOH, 64-mA IOL) to handle heavy load conditions and maintain signal integrity.
• Testability: Boundary-scan (JTAG) capabilities compliant with IEEE Standard 1149.1-1990, enabling testing of complex circuit board assemblies.
• Package: Available in a 96-pin LQFP (Low-profile Quad Flat Package), which is suitable for surface mount technology and provides space-saving advantages.

Applications:

The SN74LVTH18504APMG4 is ideal for a wide range of applications, including:

• Telecommunication Infrastructure
• Networking Equipment
• Computer Systems and Servers
• Data Storage and Signal Processing
• Industrial Control Systems

Quality and Support:

Texas Instruments provides extensive support and a robust quality system to ensure that the SN74LVTH18504APMG4 meets the rigorous standards required for industrial and commercial applications. Customers can access a wide range of technical resources, including datasheets, reference designs, and application notes, to facilitate the integration of this device into their projects.