The MC100EL23DR2G from ON Semiconductor is a high-performance, dual-rank edge-triggered D-type flip-flop integrated circuit. This device is part of ON Semiconductor's 5V ECL logic family and is designed to offer exceptional speed and reliability for a wide range of applications in the telecommunications, computing, and industrial markets.

Key Features

• Technology: The MC100EL23DR2G is built on advanced differential ECL (Emitter Coupled Logic) technology, ensuring high-speed operation with a typical propagation delay of only 1.5 ns.
• Functionality: As a dual D-type flip-flop, it features two independent flip-flops with separate D (Data), CP (Clock Pulse), and Q (Output) pins. Each flip-flop is triggered on the rising edge of the clock pulse, allowing for precise timing and synchronization.
• Output Features: The outputs are of the true ECL 10KH open-emitter type, which allows for wired-OR outputs and provides the capability to connect outputs directly to the bus lines for bus-organized systems.
• Power Supply: The device operates with a –4.2V to –5.7V power supply, which is typical for ECL logic devices, ensuring compatibility with existing ECL systems.
• Package: It comes in an 8-SOIC (0.150", 3.90mm Width) package, which is compact and suitable for densely packed PCBs.
• Temperature Range: The MC100EL23DR2G is designed to perform reliably over an extended industrial temperature range from -40°C to +85°C.

Applications

The MC100EL23DR2G is ideal for a variety of applications where high-speed data throughput and signal integrity are paramount. This includes:

• High-speed data transmission systems
• Frequency division and counting
• Serial and parallel data processing
• Communication controllers
• Process control systems
• High-performance computing systems

Quality and Reliability

ON Semiconductor is known for its commitment to quality, and the MC100EL23DR2G is no exception. It is manufactured in facilities that are certified to ISO 9001:2015 standards, ensuring that each device meets the highest quality and reliability standards.